Swerea KIMAB AB has been working with the focused ion beam (FIB) technique for several years now. The aim has been to increase internal as well as external competence regarding the large number of applications that the technique can be used for as well as being able to perform high class experiments with FIB. Well educated personnel running focused ion beam microscope in combination with customers that understand the benefits that the technique can deliver is a key factor to perform successful experiments. The aim this year was to focus on using FIB for more difficult tasks such as performing TEM lift-outs and 3D characterization of microstructures. TEM lift-outs were successfully performed and analysed in TEM on materials from SSAB Oxelösund and Uddeholms AB. 3D characterizations were done on a weld material from ESAB and two high strength low alloy (HSLA) structural steels.