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Using Heavy-ion Fault Injection to Evaluate Fault Tolerance with respect to Cluster Size in a Time-triggered Communication System
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Elektronik.
2003 (English)In: Proceedings of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS-6), April 2003, Poznan, 2003, , p. 171-176Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2003. , p. 171-176
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Natural Sciences
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URN: urn:nbn:se:ri:diva-11477Local ID: 2217OAI: oai:DiVA.org:ri-11477DiVA, id: diva2:969299
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IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS-6), April 2003, Poznan
Available from: 2016-09-13 Created: 2016-09-13 Last updated: 2025-09-23Bibliographically approved

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  • apa
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