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Analytical Extraction of a Schottky Diode Model from Broadband S-parameters
Chalmers University of Technology, Sweden.
Chalmers University of Technology, Sweden.
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation. Chalmers University of Technology, Sweden.
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation. Chalmers University of Technology, Sweden.
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2013 (English)In: IEEE transactions on microwave theory and techniques, ISSN 0018-9480, E-ISSN 1557-9670, Vol. 61, no 5, p. 1870-1878Article in journal (Refereed) Published
Abstract [en]

We present an analytic method to extract Schottky diode parasitic model parameters. All the ten unknown model parameters are extracted via a straightforward step-by-step procedure. The challenges for a proper finger inductance and series resistance extraction are discussed and solutions are recommended. The proposed method is evaluated using three sets of S-parameter data for GaAs-based planar Schottky diodes, i.e., data from measurement up to 110 GHz and 3-D electromagnetic full-wave simulations up to 600 GHz. The extracted models agree well with the measured and simulated data.

Place, publisher, year, edition, pages
2013. Vol. 61, no 5, p. 1870-1878
Keywords [en]
analytical model, equivalent circuits, millimeter-wave devices, modeling, multibias, parameter extraction, scattering parameters, Schottky diodes, terahertz
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-6497DOI: 10.1109/TMTT.2013.2251655Scopus ID: 2-s2.0-84877758367Local ID: 15825OAI: oai:DiVA.org:ri-6497DiVA, id: diva2:964335
Available from: 2016-09-08 Created: 2016-09-08 Last updated: 2025-09-23Bibliographically approved

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