Electric-Field-Induced Instability of Redox-Exfoliated Layered Transition Metal DichalcogenidesVise andre og tillknytning
2025 (engelsk)Inngår i: The Journal of Physical Chemistry C, ISSN 1932-7447, E-ISSN 1932-7455, Vol. 129, nr 5, s. 2582-2589Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]
Redox-exfoliated layered transition metal dichalcogenides (LTMDs) find many applications in nonlinear optics, displays, and electronics. The investigated redox LTMD suspensions in this work were characterized optically and found to be highly stable due to surface anionic polyoxometalates (POMs), which maintained the separation between sheets by Coulombic repulsion. However, exposure of the uniform suspensions of LTMDs to an electric field led to agglomeration of the TMDs into clumps of the material in a nearly transparent solvent. This was attributed to the electrochemical reduction of the surface anionic POMs. The electrochemical stability of the redox-exfoliated ACN-MoS2 samples was also investigated by cyclic voltammetric measurements, which confirmed the POM reduction process. This study highlights that the stability of the LTMD/POM system can be compromised by the application of a low-intensity electric field and has bearings on its reliability in optoelectronic devices.
sted, utgiver, år, opplag, sider
American Chemical Society , 2025. Vol. 129, nr 5, s. 2582-2589
Emneord [en]
Electrolytic reduction; Molybdenum compounds; Redox reactions; Coulombic repulsion; Cyclic voltammetric measurements; Electric field induced; Electrochemical reductions; Electrochemical stabilities; Highly stables; Layered transition metal dichalcogenides; MoS 2; Polyoxometalates; Reduction process; Cyclic voltammetry
HSV kategori
Identifikatorer
URN: urn:nbn:se:ri:diva-78019DOI: 10.1021/acs.jpcc.4c07187Scopus ID: 2-s2.0-85215985973OAI: oai:DiVA.org:ri-78019DiVA, id: diva2:2000869
Merknad
The authors acknowledge financial support from ConselhoNacional de Desenvolvimento Científico e Tecnológico (CNPq,Nos: 33631/2018-0 and 15245/2020-4), Fundação de AmparoàCiencia e Tecnologia de Pernambuco (FACEPE, No: IBPG1118-1.03/2), Fundação de Amparo àPesquisa do Estado doRio de Janeiro (FAPERJ, No.: E-26/211.554/2021), and Coordenação de Aperfeiçoamento de Pessoal de Nível Superior(CAPES, 001). Y.D.R.M., R.A.V., N.C., I.C.S.C., and G.A.P. acknowledge support from Air Force Office of Scientific Research (AFOSR) and the AFRL Materials and Manufacturing Directorate. I.C.S.C. acknowledges support from the National Institute of Photonics (INCT-Info, No: 555170/2005-5). D.G.is supported by the Rio de Janeiro State Foundation (FAPERJ, Nos: E-26/210.296/2022, E-26/201.254/2022, E-26/211.464/2021, and E-26/202.393/2022), the Serrapilheira Institute (No:R-2012-37959), and the Brazilian Nanocarbon Institute of Science and Technology (INCT/NanoCarbono).
2025-09-252025-09-252025-09-25bibliografisk kontrollert