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  • 101.
    Yhland, Klas
    et al.
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Eiö, Christopher P.
    NPL National Physical Laboratory, United Kingdom.
    Stenarson, Jörgen
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    A calibration procedure for electronic calibration units2014In: 84th ARFTG Microwave Measurement Conference: The New Frontiers for Microwave Measurements, 2014, , p. 7013414article id 7013414Conference paper (Refereed)
    Abstract [en]

    This paper presents a procedure for calibrating a Vector Network Analyzer (VNA) calibration kit, mechanical short, open, and load or electronic calibration unit, as a black box. The uncertainty is associated with each connector type in the calibration kit in the form of an uncertainty two-port. The method is validated by comparing results using different VNA test set configurations as well as a comparison to a traditional ripple technique.

  • 102.
    Yhland, Klas
    et al.
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Judaschke, Rolf H.
    PTB Physikalisch-Technische Bundesanstalt, Germany.
    Rausche, Florian
    PTB Physikalisch-Technische Bundesanstalt, Germany.
    Wingqvist, Claes
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Stenarson, Jörgen
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Bilateral comparison on calibration factor of a 2.92 mm power sensor2012Conference paper (Refereed)
    Abstract [en]

    This paper describes a bilateral comparison between PTB and SP on the calibration factor of a 2.92 mm thermocouple power sensor. The measurements were done at 0 dBm from 50 MHz to 40 GHz. The comparison also covers the sensor reflection coefficient over the same frequency range.

  • 103.
    Yhland, Klas
    et al.
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Stenarson, Jörgen
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Characterization of thin film resistors and capacitors integrated on GaAs membranes for submillimeter wave circuit applications2011In: Proceedings - International Conference on Indium Phosphide and Related Materials, 2011, , p. 5978368Conference paper (Refereed)
  • 104.
    Yhland, Klas
    et al.
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Stenarson, Jörgen
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Measurement Uncertainty in Power Splitter Effective Source Match2007In: IEEE Transactions on Instrumentation and Measurement, Vol. 56, no 2, p. 4-Article in journal (Refereed)
    Abstract [en]

    We present an uncertainty calculation together with a technique to assess the residual error when calibrating the effective source match of power splitters. The technique is applied to the Juroshek method, which is the most convenient way of measuring the effective source match. The technique uses an airline as impedance reference and is similar to the ripple technique used when evaluating the residual errors in vector network analyzers.

  • 105.
    Yhland, Klas
    et al.
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Stenarson, Jörgen
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Wingqvist, Claes
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    An in-circuit, non-contacting, S-para-meter measurement method2001In: Proceedings of Swedish National Symposium on Gi-gahertz Electronics, 2001, 2001Conference paper (Other academic)
  • 106.
    Zelan, Martin
    et al.
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Massa, kraft, längd och tryck.
    Arrhén, Fredrik
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Massa, kraft, längd och tryck.
    Jarlemark, Per
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
    Mollmyr, Oscar
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Massa, kraft, längd och tryck.
    Johansson, Håkan
    Simea Optics AB, Sweden.
    Characterization of a fiber-optic pressure sensor in a shock tube system for dynamic calibrations2015In: Metrologia, ISSN 0026-1394, E-ISSN 1681-7575, Vol. 52, no 1, p. 48-53Article in journal (Refereed)
    Abstract [en]

    Measurements of mechanical quantities such as pressure often take place under dynamic conditions, yet no traceable standards for the primary dynamic calibration of pressure sensors currently exist. In theory, shock tubes can provide a close to perfect step-function ideal for the calibration of pressure transducers. In this paper we investigate a system consisting of a shock tube and an ultra-fast fiber-optical sensor that is designed to be a future primary system for dynamic pressure calibrations. For reference, the fiber-optical sensor is compared to a piezoelectric sensor, and their corresponding frequency spectra are calculated. Furthermore, an investigation of the repeatability of the fiber-optical sensor, as well as a comparison with a second shock tube, is performed.

  • 107.
    Zhao, Huan
    et al.
    Chalmers University of Technology, Sweden.
    Tang, Aik Yean
    Chalmers University of Technology, Sweden.
    Sobis, Peter
    Omnisys Instruments, Sweden; Chalmers University of Technology, Sweden.
    Bryllert, Tomas
    Omnisys Instruments, Sweden.
    Yhland, Klas
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation. Chalmers University of Technology, Sweden.
    Stenarson, Jörgen
    RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation. Chalmers University of Technology, Sweden.
    Stake, Jan
    Chalmers University of Technology, Sweden.
    Submillimeter Wave S-Parameter Characterization of Integrated Membrane Circuits2011In: IEEE Microwave and Wireless Components Letters, ISSN 1531-1309, E-ISSN 1558-1764, Vol. 21, no 2, p. 110-112Article in journal (Refereed)
    Abstract [en]

    We demonstrate S-parameter characterization of membrane circuits in the WR-03 frequency band (220-325 GHz) utilizing thru-reflect-line (TRL) -calibration technique. The TRL calibration kit design features 3 µm thick GaAs membrane circuits packaged in E-plane split waveguide blocks with the reference planes inside the membrane circuit structure. A 300 GHz membrane ring resonator filter circuit has been characterized by applying the proposed calibration kit, showing good agreement with simulations.

123 101 - 107 of 107
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