Ändra sökning
Avgränsa sökresultatet
1 - 4 av 4
RefereraExporteraLänk till träfflistan
Permanent länk
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annat format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annat språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Träffar per sida
  • 5
  • 10
  • 20
  • 50
  • 100
  • 250
Sortering
  • Standard (Relevans)
  • Författare A-Ö
  • Författare Ö-A
  • Titel A-Ö
  • Titel Ö-A
  • Publikationstyp A-Ö
  • Publikationstyp Ö-A
  • Äldst först
  • Nyast först
  • Skapad (Äldst först)
  • Skapad (Nyast först)
  • Senast uppdaterad (Äldst först)
  • Senast uppdaterad (Nyast först)
  • Disputationsdatum (tidigaste först)
  • Disputationsdatum (senaste först)
  • Standard (Relevans)
  • Författare A-Ö
  • Författare Ö-A
  • Titel A-Ö
  • Titel Ö-A
  • Publikationstyp A-Ö
  • Publikationstyp Ö-A
  • Äldst först
  • Nyast först
  • Skapad (Äldst först)
  • Skapad (Nyast först)
  • Senast uppdaterad (Äldst först)
  • Senast uppdaterad (Nyast först)
  • Disputationsdatum (tidigaste först)
  • Disputationsdatum (senaste först)
Markera
Maxantalet träffar du kan exportera från sökgränssnittet är 250. Vid större uttag använd dig av utsökningar.
  • 1.
    Nilsson, Mikael G.
    et al.
    Lund University, Sweden; Volvo, Sweden.
    Hallbjörner, Paul
    RISE., SP – Sveriges Tekniska Forskningsinstitut.
    Arabäck, Niklas
    RISE., SP – Sveriges Tekniska Forskningsinstitut.
    Bergqvist, Björn M.
    Volvo, Sweden.
    Abbas, Taimoor
    Volvo, Sweden.
    Tufvesson, Fredrik
    Lund University, Sweden.
    Measurement Uncertainty, Channel Simulation, and Disturbance Characterization of an Over-the-Air Multiprobe Setup for Cars at 5.9 GHz2015Ingår i: IEEE transactions on industrial electronics (1982. Print), ISSN 0278-0046, E-ISSN 1557-9948, Vol. 62, nr 12, s. 7859-7869, artikel-id 7234918Artikel i tidskrift (Refereegranskat)
    Abstract [en]

    Over-the-air (OTA) multiprobe setups provide an efficient way to characterize the performance of today's advanced wireless communication systems. In this paper, the measurement uncertainty of such a setup using a car as a test object is characterized through three experiments: measurement system analysis, channel sounder measurements, and probe coupling measurements. Four issues were in focus for the analysis: precision, realization of the wireless communication channel, coupling between the probes, and the influence of the test object size. The analysis shows that a large test object such as a car in an OTA multiprobe ring will affect the measurement uncertainty, but only to a small degree. The measurement uncertainty expressed as expanded uncertainty was below +/-1 dB, which is a level that would not violate best practice total uncertainty levels for comparable OTA methods.

  • 2.
    Ricci, Stefano
    et al.
    University of Florence, Italy.
    Meacci, Valentino
    University of Florence, Italy.
    Birkhofer, Beat
    Sika Services AG, Switzerland.
    Wiklund, Johan
    RISE - Research Institutes of Sweden, Biovetenskap och material, Jordbruk och livsmedel.
    FPGA-based system for in-line measurement of velocity profiles of fluids in industrial pipe flow2017Ingår i: IEEE transactions on industrial electronics (1982. Print), ISSN 0278-0046, E-ISSN 1557-9948, Vol. 64, nr 5, s. 3997-4005Artikel i tidskrift (Refereegranskat)
    Abstract [en]

    The rheology of a fluid flowing in an industrial process pipe can be calculated by combining the pressure drop and the velocity profile that the fluid develops across the tube diameter. The profile is obtained noninvasively through an ultrasound Doppler investigation. Unfortunately, at present, no system capable of real-time velocity profile assessment is available for in-line industrial rheological measurements, and tests are operated by manually moving fluid specimens to specialized laboratories. In this work, we present an embedded system capable of in-line and real-time measurement of velocity profile and pressure drop, which enables the automatic rheological characterization of non-Newtonian fluids in process pipes. The system includes all the electronics for the ultrasound front-end, as well as the digital devices for the real-time calculation of the velocity profile. The proposed system is highly programmable, low-noise, and specifically targeted for industrial use. It is shown capable of producing, for example, 512-point velocity profiles at 45 Hz rate. An application is presented where a sludge fluid, flowing at 600 L/min in a 48 mm diameter high-grade stainless steel pipe, is characterized in real-time with a ±5% accuracy.

  • 3.
    Sadik, Diane
    et al.
    KTH Royal Institute of Technology, Sweden.
    Colmenares, Juan
    KTH Royal Institute of Technology, Sweden.
    Lim, Jan Kwon
    RISE Research Institutes of Sweden.
    Bakowski, Mietek
    RISE Research Institutes of Sweden, Digitala system, Smart hårdvara.
    Nee, Hans Peter
    KTH Royal Institute of Technology, Sweden.
    Comparison of Thermal Stress during Short-Circuit in Different Types of 1.2 kV SiC Transistors Based on Experiments and Simulations2020Ingår i: IEEE transactions on industrial electronics (1982. Print), ISSN 0278-0046, E-ISSN 1557-9948Artikel i tidskrift (Refereegranskat)
    Abstract [en]

    The temperature evolution during a short-circuit fault in the dies of three different Silicon Carbide 1200-V power devices is presented. Transient electro-thermal simulations were performed based on the reconstructed structure of commercially available devices. The simulations reveal the location of the hottest point in each device. The nonisothermal electrical analysis supports the necessity to turn OFF short-circuit events rapidly to protect the immunity of the device after a fault. The analysis also reveal differences in delay required to turn OFF devices depending on their type. A thorough analysis of the temperature rise in the die of the SiC MOSFET device is also presented, where the maximum temperature with regards to different fault cases and circuit characteristics is presented. The impact of the gate resistance, circuit inductance, detection time, drain-source voltage, and gate-source voltage are considered.

  • 4.
    Sadik, Diane-Perle
    et al.
    KTH Royal Institute of Technology, Sweden.
    Colmenares, Juan
    KTH Royal Institute of Technology, Sweden.
    Tolstoy, Georg
    KTH Royal Institute of Technology, Sweden.
    Peftitsis, Dimosthenis
    ETH Zurich, Switzerland.
    Bakowski, Mietek
    RISE., Swedish ICT, Acreo.
    Rabkowski, Jacek
    Warsaw University of Technology, Poland.
    Nee, Hans-Peter
    KTH Royal Institute of Technology, Sweden.
    Short-Circuit Protection Circuits for Silicon-Carbide Power Transistors2016Ingår i: IEEE transactions on industrial electronics (1982. Print), ISSN 0278-0046, E-ISSN 1557-9948, Vol. 63, nr 4, s. 1995-2004, artikel-id 7349199Artikel i tidskrift (Refereegranskat)
    Abstract [en]

    An experimental analysis of the behavior under short-circuit conditions of three different silicon-carbide (SiC) 1200-V power devices is presented. It is found that all devices take up a substantial voltage, which is favorable for detection of short circuits. A transient thermal device simulation was performed to determine the temperature stress on the die during a short-circuit event, for the SiC MOSFET. It was found that, for reliability reasons, the short-circuit time should be limited to values well below Si IGBT tolerances. Guidelines toward a rugged design for short-circuit protection (SCP) are presented with an emphasis on improving the reliability and availability of the overall system. A SiC device driver with an integrated SCP is presented for each device-type, respectively, where a short-circuit detection is added to a conventional driver design in a simple way. The SCP driver was experimentally evaluated with a detection time of 180 ns. For all devices, short-circuit times well below 1 s were achieved.

1 - 4 av 4
RefereraExporteraLänk till träfflistan
Permanent länk
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annat format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annat språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
v. 2.35.10