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Impact of laminate cracks under solder pads on the fatigue lives of ball grid array solder joints
RISE - Research Institutes of Sweden, Materials and Production, IVF.ORCID iD: 0000-0002-8556-0925
RISE - Research Institutes of Sweden, Materials and Production, IVF.
2015 (English)In: Microelectronics and reliability, ISSN 0026-2714, E-ISSN 1872-941X, Vol. 55, no 11, p. 2354-2370Article in journal (Refereed) Published
Abstract [en]

This paper reports how the solder joint fatigue lives of three types of lead free plastic BGA components were affected by cracks formed in the printed PCB laminate during a thermal cycling test. The investigation showed that cracks were formed in the laminate for all three tested components. For one of the components having a large chip with solder joints located under the chip, very large cracks were formed in the PCB laminate beneath some solder pads.For lead-free solder joints to BGA components consisting of near eutectic solders based on tin, silver and copper, a large fraction of the solder joints may consist of one single tin grain. Due to anisotropy of tin grains, each solder joint to a BGA component will experience a unique stress condition which will make laminate cracking more likely under certain solder joints.The laminate cracks increased the flexibility of the joints and thereby improved the fatigue lives of the solder joints. Therefore, an estimation of the fatigue lives of solder joints to BGA components based on the results from a thermal cycling test may lead to an overestimation of the fatigue lives if products will be exposed to smaller temperature changes in the field than in the test.If cracks are not formed in the PCB laminate, or if the extent of cracking is small, single-grained solder joints can be expected to result in a high spread in failure distribution with some quite early failures.

Place, publisher, year, edition, pages
2015. Vol. 55, no 11, p. 2354-2370
Keywords [en]
Anisotropy of tin grains, BGA components, Laminate cracking, Lead-free soldering, Solder joint reliability
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:ri:diva-13298DOI: 10.1016/j.microrel.2015.07.014Scopus ID: 2-s2.0-84937901816OAI: oai:DiVA.org:ri-13298DiVA, id: diva2:973504
Available from: 2016-09-22 Created: 2016-09-22 Last updated: 2019-07-05Bibliographically approved

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Tegehall, Per-Erik

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