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Origin of goss texture during secondary recrystallisation in silicon-steel
RISE, Swerea, Swerea KIMAB.
2012 (English)Conference paper, Published paper (Refereed)
Abstract [en]

Primary recrystallised sheets of 3% silicon steel from two different industrial processing routes have been examined after laboratory annealing to initiate secondary recrystallisation. Metallography included etching to reveal individual dislocations and sub-boundaries as well as EBSD in scanning electron microscopy. Residual low angle boundaries are not normally observed inside the secondary grains. The growth of secondaries appears to occur in a jerky manner, associated with local intrusions into the primary matrix that destabilise the interface. The frequency of occurrence of special low energy grain boundaries such as ∑9 and ∑5 is believed to dictate the selectivity of the Goss orientation in both types of steel sheet. © (2012) Trans Tech Publications, Switzerland.

Place, publisher, year, edition, pages
2012. Vol. 715-716, 73-80 p.
Series
Materials Science Forum, ISSN 0255-5476
Keyword [en]
Goss texture, Grain boundary, Secondary recrystallisation, Silicon steel
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:ri:diva-12946DOI: 10.4028/www.scientific.net/MSF.715-716.73ISBN: 9783037853900 (print)OAI: oai:DiVA.org:ri-12946DiVA: diva2:973139
Conference
4th International Conference on Recrystallization and Grain Growth, ReX and GG IV, Sheffield, 4 July 2010 through 9 July 2010, 89704
Available from: 2016-09-22 Created: 2016-09-22Bibliographically approved

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