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Noise temperature of an electronic tuner for noise parameter measurement systems
Chalmers University of Technology, Sweden.
Chalmers University of Technology, Sweden.
Chalmers University of Technology, Sweden.
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
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2012 (English)In: 79th ARFTG Microwave Measurement Conference: Non-Linear Measurement Systems, ARFTG 2012, 2012, , p. 6291197article id 6291197Conference paper, Published paper (Refereed)
Abstract [en]

In this paper, the noise temperature of an electronic tuner is determined and its significance for the suitability of such tuners in noise parameter measurement systems discussed. The noise temperature of the tuner was found to be higher than the ambient room temperature in the laboratory and vary significantly between tuner states. For impedance states with small input reflections coefficients, the excess noise temperature is around 25 K. For some of the states with higher reflection coefficients, this figure increases, reaching around 45 K at |Γ| = 0.75. Unless accounted for, this leads to errors in noise parameter extraction when using an electronic tuner in noise parameter measurements.

Place, publisher, year, edition, pages
2012. , p. 6291197article id 6291197
Keywords [en]
Excess noise, Noise parameter extraction, Noise parameters, Noise temperature, Room temperature, Small inputs
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-12546DOI: 10.1109/ARFTG79.2012.6291197Scopus ID: 2-s2.0-84867774213Local ID: 23994OAI: oai:DiVA.org:ri-12546DiVA, id: diva2:970370
Conference
79th ARFTG Microwave Measurement Conference: Non-Linear Measurement Systems, ARFTG 2012; Montreal, QC; Canada; 22 June, 2012
Available from: 2016-09-13 Created: 2016-09-13 Last updated: 2020-12-21Bibliographically approved

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