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Influence of waveguide width errors on TRL and LRL calibrations
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
2012 (English)In: 79th ARFTG Microwave Measurement Conference: Non-Linear Measurement Systems, 2012, , p. 6291182Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2012. , p. 6291182
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Natural Sciences
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URN: urn:nbn:se:ri:diva-12516Local ID: 23928OAI: oai:DiVA.org:ri-12516DiVA, id: diva2:970340
Conference
79th ARFTG Microwave Measurement Conference: Non-Linear Measurement Systems, ARFTG 2012; Montreal, QC; Canada; 22 June, 2012
Available from: 2016-09-13 Created: 2016-09-13Bibliographically approved

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