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Using Heavy-ion Fault Injection to Evaluate Fault Tolerance with respect to Cluster Size in a Time-triggered Communication System
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Elektronik.
2003 (English)In: Proceedings of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS-6), April 2003, Poznan, 2003, , 171-176 p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2003. , 171-176 p.
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Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-11477Local ID: 2217OAI: oai:DiVA.org:ri-11477DiVA: diva2:969299
Conference
IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS-6), April 2003, Poznan
Available from: 2016-09-13 Created: 2016-09-13Bibliographically approved

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CiteExportLink to record
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  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
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Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
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  • Other locale
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Output format
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