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An in-circuit, non-contacting, S-para-meter measurement method,
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
2001 (English)In: Proceedings of 57th ARFTG Conference, 2001., 2001Conference paper, Published paper (Refereed)
Abstract [en]

A method for measuring S-parameters of a circuit embedded in a planar circuit environment is presented. The method utilizes an inductive and a capacitive probe. Experimental results are presented for probe measurements of reflection coefficient from 0.7 to 20 GHz with good agreement to verifying measurements up to 14 GHz. The method shows great promise for in-circuit Sparameter testing that has previously required physical modification or even complete disassembly to test sub-circuits in a microstrip environment.

Place, publisher, year, edition, pages
2001.
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-11403Local ID: 1833OAI: oai:DiVA.org:ri-11403DiVA: diva2:969225
Conference
57th ARFTG Conference, 2001.
Available from: 2016-09-13 Created: 2016-09-13Bibliographically approved

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