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Single-Flange 2-Port TRL Calibration for Accurate THz S-Parameter Measurements of Waveguide Integrated Circuits
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
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2014 (English)In: IEEE Transactions on Terahertz Science and Technology, ISSN 2156-342X, Vol. 4, no 5, 582-587 p.Article in journal (Refereed)
Abstract [en]

This paper describes a single flange 2-port measurement setup for S-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguide manufacturing tolerances. Change time of standards is also improved, reducing the influence of VNA drift on the uncertainty. A TRL calibration kit has been manufactured and measurements are demonstrated in WR-03 (220-325 GHz).

Place, publisher, year, edition, pages
2014. Vol. 4, no 5, 582-587 p.
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Natural Sciences
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URN: urn:nbn:se:ri:diva-6643Local ID: 18992OAI: oai:DiVA.org:ri-6643DiVA: diva2:964482
Available from: 2016-09-08 Created: 2016-09-08Bibliographically approved

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