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Sensitivity Analysis of TRL Calibration in Waveguide Integrated Membrane Circuits
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
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2013 (English)In: IEEE Transactions on Terahertz Science and Technology, ISSN 2156-342X, Vol. 3, no 5, p. 558-565Article in journal (Refereed)
Abstract [en]

We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in the WR-03 waveguide band (220-325 GHz). The impact of waveguide and membrane circuit misalignment, as well as waveguide dimension mismatch is investigated. The analysis is performed for the thru-reflect-line (TRL) calibration applied to E-plane split waveguide blocks carrying membrane circuits. The analysis shows a large influence of the waveguide width tolerance on transmission and reflection phase after the TRL calibration. For a 20 mm long rectangular waveguide with a ± 5 µm width tolerance a phase uncertainty as large as ± 45° for reflection and ± 30° for transmission measurements is observed.

Place, publisher, year, edition, pages
2013. Vol. 3, no 5, p. 558-565
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Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-6496Local ID: 15824OAI: oai:DiVA.org:ri-6496DiVA, id: diva2:964334
Available from: 2016-09-08 Created: 2016-09-08Bibliographically approved

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CiteExportLink to record
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