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Organic geochemical microanalysis by time-of-flight secondary ion mass spectrometry (TOF-SIMS).
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Sveriges tekniska forskningsinstitut, SP – Sveriges Tekniska Forskningsinstitut / Funktionella material (KMf).ORCID iD: 0000-0002-2696-7215
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Sveriges tekniska forskningsinstitut, SP – Sveriges Tekniska Forskningsinstitut / Funktionella material (KMf).ORCID iD: 0000-0002-4975-6074
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Sveriges tekniska forskningsinstitut, SP – Sveriges Tekniska Forskningsinstitut / Funktionella material (KMf).ORCID iD: 0000-0001-8877-8236
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2008 (English)In: Geostandards and Geoanalytical Research, Vol. 32, no 3, p. 267-277Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2008. Vol. 32, no 3, p. 267-277
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Natural Sciences
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URN: urn:nbn:se:ri:diva-6095Local ID: 9853OAI: oai:DiVA.org:ri-6095DiVA, id: diva2:963930
Available from: 2016-09-08 Created: 2016-09-08 Last updated: 2023-06-07Bibliographically approved

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Sjövall, PeterSiljeström, SandraLausmaa, Jukka

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