Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
The effect of variations in temperature cycling profile and mechanical properties of solder on thermo-mechanical reliability of a lead-free BGA package
Jönköping University, Sweden.
Saab AB, Sweden.
RISE, SP – Sveriges Tekniska Forskningsinstitut.
RISE, SP – Sveriges Tekniska Forskningsinstitut.ORCID iD: 0000-0002-6730-0214
Show others and affiliations
2015 (English)In: 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2015, p. 165-169, article id 7103102Conference paper, Published paper (Refereed)
Abstract [en]

The paper investigates the effect of variations both in temperature cycling profile and in SAC305 solder Young's modulus in the PBGA256 package on the thermo-mechanical reliability. FE simulations quantify the effect of cycle reduction and counting techniques by introducing different temperature profiles having identical dwell- and period time characteristics. A difference of 30% in predicted accumulated creep strain energy density per cycle has been determined for the studied profiles. Under the provided modelling assumptions and simplifications, the maximum variation of the thermal fatigue life of SAC305 solder joints is within 30% as the result of experimentally determined Young's modulus variation in as-delivered packages.

Place, publisher, year, edition, pages
2015. p. 165-169, article id 7103102
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-632DOI: 10.1109/EuroSimE.2015.7103102Scopus ID: 2-s2.0-84944810048ISBN: 978-1-4799-9950-7 (electronic)OAI: oai:DiVA.org:ri-632DiVA, id: diva2:944516
Conference
16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2015), April 19-22, 2015, Budapest, Hungary
Available from: 2016-06-29 Created: 2016-06-29 Last updated: 2023-06-07Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records

Johannesson, PärLeisner, Peter

Search in DiVA

By author/editor
Johannesson, PärLeisner, Peter
By organisation
SP – Sveriges Tekniska Forskningsinstitut
Natural Sciences

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 43 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf