Surface states characterization and simulation of type-II In(Ga)Sb quantum dot structures for processing optimization of LWIR detectorsShow others and affiliations
2013 (English)In: Proceedings of SPIE - The International Society for Optical Engineering, 2013, Vol. 8704, article id 870433Conference paper, Published paper (Refereed)
Abstract [en]
Quantum structures base on type-II In(Ga)Sb quantum dots (QDs) embedded in an InAs matrix were used as active material for achieving long-wavelength infrared (LWIR) photodetectors in this work. Both InAs and In(Ga)Sb are narrow band semiconductor materials and known to possess a large number of surface states, which apparently play significant impact for the detector's electrical and optical performance. These surface states are caused not only by material or device processing induced defects but also by surface dangling bonds, oxides, roughness and contaminants. To experimentally analyze the surface states of the QD structures treated by different device fabrication steps, atomic force microscopy (AFM), scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDX) and X-ray photoelectron spectroscopy (XPS) measurements were performed. The results were used to optimize the fabrication process of the LWIR photodetectors in our ongoing project. The dark current and its temperature dependence of the fabricated IR photodetectors were characterized in temperature range 10 K to 300 K, and the experiment results were analyzed by a theoretic modeling obtained using simulation tool MEDICI.
Place, publisher, year, edition, pages
2013. Vol. 8704, article id 870433
Keywords [en]
In(Ga)Sb quantum dots, LWIR photodetectors, surface states and dark current, Type-II, Energy dispersive x-ray spectroscopy, Fabrication process, Long-wavelength infrared, Processing optimizations, Quantum dot structure, Surface dangling bonds, Temperature dependence, Atomic force microscopy, Energy dispersive spectroscopy, Gallium, Infrared radiation, Photodetectors, Photoelectrons, Photons, Scanning electron microscopy, Structural optimization, Surface defects, Surface states, X ray photoelectron spectroscopy, Semiconductor quantum dots
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:ri:diva-47495DOI: 10.1117/12.2015966Scopus ID: 2-s2.0-84883754188ISBN: 9780819494955 (print)OAI: oai:DiVA.org:ri-47495DiVA, id: diva2:1465391
Conference
39th Infrared Technology and Applications; Baltimore, MD; United States; 29 April 2013 through 3 May 2013
2020-09-092020-09-092024-02-06Bibliographically approved