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Evaluating the Optimized Mutation Analysis Approach in Context of Model-Based Testing
RISE Research Institutes of Sweden, Digital Systems, Industrial Systems.
RISE Research Institutes of Sweden.ORCID iD: 0000-0002-6807-2663
Department of Computer Science, Saudi Arabia.
2020 (English)In: 2020 International Conference on Emerging Trends in Smart Technologies, ICETST 2020, Institute of Electrical and Electronics Engineers Inc. , 2020Conference paper, Published paper (Refereed)
Abstract [en]

Data flow analysis rules help ensuring the correct flow of data and identifying the related state issues within the model-based testing practices. Though, studies have produced encouraging results for detecting data flow and states-oriented faults and enormous research work has been carried out in this direction, still optimal results from multiple criteria have not been achieved simultaneously. We are aiming to come up with a comprehensive approach that is able to (1): find the define-usage errors, (2): automatically generate the test data for UML state machines (3): mutate the states and flow with different level of complexity achieving efficient mutation score (4): provide the optimal def-use path complete coverage (5): applicable to all UML diagrams. This work in progress is a first step in this direction and we have validated our approach through an implementation which can run against state diagrams. Results have been tested based on a case study with one of the latest approaches and have proven to be promising and effective.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2020.
Keywords [en]
Ant Colony Optimization, Automated Test Case Generation, Data Flow Testing, Evolutionary Testing, Model Based Software Testing, Mutation Analysis, Search Based Software Engineering, Data transfer, Model checking, Complete coverages, Model based testing, Multiple criteria, Mutation score, Optimal results, UML state machine, Work in progress, Data flow analysis
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-45090DOI: 10.1109/ICETST49965.2020.9080737Scopus ID: 2-s2.0-85084959500ISBN: 9781728171135 (print)OAI: oai:DiVA.org:ri-45090DiVA, id: diva2:1450646
Conference
2020 International Conference on Emerging Trends in Smart Technologies, ICETST 2020, 26 March 2020 through 27 March 2020
Note

 Funding text 1: “This work was carried out with the support of ERCIM ‘Alain Bensoussan’ Fellowship Programme.”

Available from: 2020-07-01 Created: 2020-07-01 Last updated: 2020-12-01Bibliographically approved

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Rauf, Abdul

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