Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Structural and chemical imaging analysis of bitumen
Nynas AB, Sweden.
RISE - Research Institutes of Sweden, Bioscience and Materials, Chemistry and Materials.ORCID iD: 0000-0002-2696-7215
Nynas NV, Belgium.
Antwerp University, Belgium.
Show others and affiliations
2019 (English)In: International Journal on Road Materials and Pavement Design, ISSN 1468-0629, E-ISSN 2164-7402Article in journal (Refereed) Epub ahead of print
Abstract [en]

Microstructures of bitumen surfaces (both air-cooled and fractured) were imaged by atomic force microscopy (AFM) and chemically characterised by time-of-flight secondary ion mass spectrometry (TOF-SIMS). For certain air-cooled bitumen surfaces, bee structures were observed by AFM, and chemical explanation by wax crystallisation was confirmed by TOF-SIMS analysis. Unlike the air-cooled surfaces, the fracture surfaces generally did not show clear structure patterns. Furthermore, TOF-SIMS analysis was conducted on the tube-like or worm structures which were generated by environmental scanning electron microscopy (ESEM) on the bitumen surfaces. In general, very small chemical differences were observed between the structured and unstructured areas, as well as between different areas of the structure. To understand the formation of the ESEM structures, possible contributing factors were examined, from which a mechanism involving electron-induced heating was proposed.

Place, publisher, year, edition, pages
Taylor and Francis Ltd. , 2019.
Keywords [en]
AFM, bitumen, ESEM, microstructure, TOF-SIMS, wax, Atomic force microscopy, Bituminous materials, Cooling systems, Organic polymers, Scanning electron microscopy, Secondary ion mass spectrometry, Waxes, Contributing factor, Environmental scanning electron microscopies (ESEM), Fracture surfaces, Time of flight secondary ion mass spectrometry, ToF SIMS, TOF-SIMS analysis, Chemical analysis
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-39930DOI: 10.1080/14680629.2019.1661274Scopus ID: 2-s2.0-85071732430OAI: oai:DiVA.org:ri-39930DiVA, id: diva2:1352808
Available from: 2019-09-19 Created: 2019-09-19 Last updated: 2019-09-19Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records BETA

Sjövall, Peter

Search in DiVA

By author/editor
Sjövall, Peter
By organisation
Chemistry and MaterialsSurface, Process and Formulation
In the same journal
International Journal on Road Materials and Pavement Design
Natural Sciences

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 4 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
v. 2.35.8