Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Drain-current deep level transient spectroscopy investigation on epitaxial graphene/6H-SiC field effect transistors
RISE, Swedish ICT, Acreo.
RISE, Swedish ICT, Acreo.
Show others and affiliations
2014 (English)In: Mater. Sci. Forum, 2014, p. 436-439Conference paper, Published paper (Refereed)
Abstract [en]

The electrically active deep levels in a graphene/silicon carbide field effect transistor (FET) were investigated by drain-current deep level transient spectroscopy (ID-DLTS). An evaluation procedure for ID-DLTS is developed in order to obtain the activation energy, the capture cross section and the trap concentration. We observed three defect centers corresponding to the intrinsic defects E1/E2, Ei and Z1/Z2 in n-type 6H-SiC. The determined parameters have been verified by conventional capacitance DLTS.

Place, publisher, year, edition, pages
2014. p. 436-439
Keywords [en]
Activation energy, Deep level transient spectroscopy, Defects, Silicon carbide, Capture cross sections, Deep-levels, Defect centers, Electrically actives, Epitaxial graphene, Intrinsic defects, Trap concentration, Field effect transistors
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-35503DOI: 10.4028/www.scientific.net/MSF.778-780.436Scopus ID: 2-s2.0-84896068228ISBN: 9783038350101 (print)OAI: oai:DiVA.org:ri-35503DiVA, id: diva2:1263112
Conference
29 September 2013 through 4 October 2013, Miyazaki
Available from: 2018-11-14 Created: 2018-11-14 Last updated: 2018-11-14Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus
By organisation
Acreo
Natural Sciences

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
v. 2.35.8