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Reliability study of GaN HEMTs
Jönköping University, Sweden.
RISE, SP – Sveriges Tekniska Forskningsinstitut.
Saab AB, Sweden.
RISE, Swedish ICT, Acreo.
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2016 (English)Conference paper, Oral presentation with published abstract (Other academic)
Place, publisher, year, edition, pages
2016.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:ri:diva-32927OAI: oai:DiVA.org:ri-32927DiVA, id: diva2:1169776
Conference
ISiCPEAW 2016 - International SiC Power Electronics Applications Workshop, May 18-19, 2016, Stockholm, Sweden
Available from: 2017-12-29 Created: 2017-12-29 Last updated: 2019-06-25Bibliographically approved

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Leisner, Peter

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SP – Sveriges Tekniska ForskningsinstitutAcreo
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  • apa
  • harvard1
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  • de-DE
  • en-GB
  • en-US
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