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Characterization of dielectric properties of insulating materials for use in an HVDC reference divider
RISE, SP – Sveriges Tekniska Forskningsinstitut.ORCID iD: 0000-0001-5044-8266
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Sveriges tekniska forskningsinstitut.
RISE, SP – Sveriges Tekniska Forskningsinstitut.ORCID iD: 0000-0002-5121-8152
MIKES, Finland.
2012 (English)In: CPEM Digest (Conference on Precision Electromagnetic Measurements), 2012, p. 80-81, article id 6250670Conference paper, Published paper (Refereed)
Abstract [en]

Dielectric properties of polyethylene (PE), polyoxymethylene (POM) and ceramic glass (MACOR) are compared. Their suitability to act as a support for a resistor chain in a wideband HVDC reference divider is characterized. The support material forms a parallel capacitance to the resistive resistor chain, and a bandwidth of more than 100 kHz is needed. The frequency dependence of dielectric constant has been measured in the range 20 - 100 kHz. The depolarization current of these materials was measured to be at least 6 orders of magnitude lower than the current through the resistive chain. Neither MACOR nor PE does build up space charge which POM does. Possessing the highest dielectric constant makes MACOR well suited for the application.

Place, publisher, year, edition, pages
2012. p. 80-81, article id 6250670
Keywords [en]
current measurement, dielectric, high-voltage techniques, HVDC, metrology, Ceramic glass, Depolarization currents, Frequency dependence, High voltage techniques, Orders of magnitude, Parallel capacitance, Polyoxymethylene, Support materials, Wide-band, Acetal resins, Dielectric materials, Electric current measurement, Electromagnetism, Measurements, Resistors, Dielectric properties
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:ri:diva-32465DOI: 10.1109/CPEM.2012.6250670Scopus ID: 2-s2.0-84866783196ISBN: 9781467304399 (print)OAI: oai:DiVA.org:ri-32465DiVA, id: diva2:1154714
Conference
2012 Conference on Precision Electromagnetic Measurements, CPEM 2012, 1 July 2012 through 6 July 2012, Washington, DC
Available from: 2017-11-03 Created: 2017-11-03 Last updated: 2021-01-13Bibliographically approved

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Elg, Alf PeterBergman, Anders

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SP – Sveriges Tekniska ForskningsinstitutSP Sveriges tekniska forskningsinstitut
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