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Time-of-flight secondary ion mass spectrometry imaging of dopant diffusion in optical fiber
RISE, Swedish ICT, Acreo.
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2003 (English)In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 203-204, p. 3458-61Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2003. Vol. 203-204, p. 3458-61
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Computer and Information Sciences
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URN: urn:nbn:se:ri:diva-32240OAI: oai:DiVA.org:ri-32240DiVA: diva2:1152099
Available from: 2017-10-24 Created: 2017-10-24 Last updated: 2018-01-13Bibliographically approved

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v. 2.30.1