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Deep defects in 3C-SiC generated by H+- He+-implantation or by irradiation with high-energy electrons
Weidner, M
Trapaidze, L
Pensl, G
Reshanov, SA
Schöner, A
RISE, Swedish ICT, Acreo.
Itoh, H
Ohshima, T
Kimoto, T
Show others and affiliations
2010 (English)
In:
Materials Science Forum, ISSN 0255-5476, E-ISSN 1662-9752, Vol. 645-648, p. 439-442
Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2010. Vol. 645-648, p. 439-442
National Category
Computer and Information Sciences
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URN:
urn:nbn:se:ri:diva-32097
OAI: oai:DiVA.org:ri-32097
DiVA, id:
diva2:1151956
Available from:
2017-10-24
Created:
2017-10-24
Last updated:
2020-12-01
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Materials Science Forum
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modern-language-association-8th-edition
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