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Comparison of total losses of 1.2kV SiC JFET BJT in DC-DC converter including gate driver
Lim, Jang-Kwon
RISE - Research Institutes of Sweden (2017-2019), ICT, Acreo.
ORCID iD:
0000-0002-9850-9440
Tolstoy, G
Peftitsis, D
Rabkowski, J
Bakowski, Mietek
RISE, Swedish ICT, Acreo.
ORCID iD:
0000-0002-9512-2689
Nee, H-P
KTH Royal Institute of Technology, Sweden.
Show others and affiliations
2011 (English)
In:
Materials Science Forum, ISSN 0255-5476, E-ISSN 1662-9752, Vol. 679-80, p. 649-52
Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2011. Vol. 679-80, p. 649-52
National Category
Computer and Information Sciences
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URN:
urn:nbn:se:ri:diva-32071
OAI: oai:DiVA.org:ri-32071
DiVA, id:
diva2:1151930
Available from:
2017-10-24
Created:
2017-10-24
Last updated:
2024-04-08
Bibliographically approved
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Lim, Jang-Kwon
Bakowski, Mietek
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modern-language-association-8th-edition
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modern-language-association-8th-edition
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