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Characterizing Grain-Oriented Silicon Steel Sheet Using Automated High-Resolution Laue X-ray Diffraction
Deakin University, Australia.
Deakin University, Australia.
CSIRO Manufacturing, Australia.
RISE - Research Institutes of Sweden, Swerea, Swerea KIMAB.
2017 (English)In: Metallurgical and Materials Transactions. A, ISSN 1073-5623, E-ISSN 1543-1940Article in journal (Refereed) In press
Abstract [en]

Controlling texture in grain-oriented (GO) silicon steel sheet is critical for optimization of its magnetization performance. A new automated laboratory system, based on X-ray Laue diffraction, is introduced as a rapid method for large scale grain orientation mapping and texture measurement in these materials. Wide area grain orientation maps are demonstrated for both macroetched and coated GO steel sheets. The large secondary grains contain uniform lattice rotations, the origins of which are discussed.

Place, publisher, year, edition, pages
2017.
Keyword [en]
Silicon steel, Steel sheet, Automated laboratory system, Grain orientation, Grain oriented silicon steel sheet, Grain-oriented silicon steel, High resolution, Lattice rotations, Laue diffraction, Texture measurement, X ray diffraction
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:ri:diva-31346DOI: 10.1007/s11661-017-4313-5Scopus ID: 2-s2.0-85029065189OAI: oai:DiVA.org:ri-31346DiVA: diva2:1147579
Available from: 2017-10-06 Created: 2017-10-06 Last updated: 2017-10-06Bibliographically approved

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