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Reliability of new SiC BJT power modules for fully electric vehicles
Fraunhofer ENAS.
RISE - Research Institutes of Sweden, Swerea, Swerea IVF.ORCID iD: 0000-0002-6483-8924
Fairchild Semiconductor.
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2014 (English)Conference paper, Oral presentation with published abstract (Other academic)
Place, publisher, year, edition, pages
2014. p. 235-244
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:ri:diva-31279OAI: oai:DiVA.org:ri-31279DiVA, id: diva2:1143560
Conference
To be published in Proceedings of AMAA , 23-24 June
Available from: 2017-09-21 Created: 2017-09-21 Last updated: 2023-05-16Bibliographically approved

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Andersson, Dag

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Brinkfeldt, KlasAndersson, Dag
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Swerea IVF
Electrical Engineering, Electronic Engineering, Information Engineering

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