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Using SEM quad BSEimages for roughness measurement – calibration of reconstructed surfaces
RISE - Research Institutes of Sweden, Swerea, Swerea IVF.ORCID iD: 0000-0003-3656-1806
2016 (English)Conference paper, Abstract (Other academic)
Place, publisher, year, edition, pages
2016.
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:ri:diva-30207OAI: oai:DiVA.org:ri-30207DiVA: diva2:1129584
Conference
5th International Conference on Surface Metrology, Poznan, Polen, April 4-7
Available from: 2017-08-04 Created: 2017-08-04Bibliographically approved

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CiteExportLink to record
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  • apa
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