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Comparing GaAs and graphene QHR standards for resistance realisation at SP
Bergsten, Tobias
RISE - Research Institutes of Sweden, Safety and Transport, Measurement Science and Technology.
(MTp)
ORCID iD:
0000-0003-2330-9898
Eklund, Gunnar
RISE - Research Institutes of Sweden, Safety and Transport, Measurement Science and Technology.
(MTp)
He, Hans
Chalmers University of Techology, Sweden.
(Chalmers)
2016 (English)
Conference paper, Poster (with or without abstract) (Other academic)
Place, publisher, year, edition, pages
2016.
National Category
Engineering and Technology
Identifiers
URN:
urn:nbn:se:ri:diva-29104
OAI: oai:DiVA.org:ri-29104
DiVA, id:
diva2:1081247
Conference
Conference on Precision Electromagnetic Measurements (CPEM) 2016
Projects
EMRP GraphOhm
Available from:
2017-03-13
Created:
2017-03-13
Last updated:
2019-01-03
Bibliographically approved
Open Access in DiVA
Poster
(11554 kB)
103 downloads
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FULLTEXT01.pdf
File size
11554 kB
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SHA-512
f110bb62419573f850654e99b4ee92a6fe02e5e2bc602efea2ce3c164218644c6c6c81e48d5a3d59257fdad22d36f6eb6e2afcb48f9e9566350b1d903105f371
Type
fulltext
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application/pdf
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Bergsten, Tobias
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Measurement Science and Technology
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Total: 103 downloads
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Direct link
http://ri.diva-portal.org/smash/record.jsf?pid=diva2:1081247
Cite
Citation style
apa
harvard1
ieee
modern-language-association-8th-edition
vancouver
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apa
harvard1
ieee
modern-language-association-8th-edition
vancouver
Other style
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Language
de-DE
en-GB
en-US
fi-FI
nn-NO
nn-NB
sv-SE
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de-DE
en-GB
en-US
fi-FI
nn-NO
nn-NB
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v. 2.35.5