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Thermal calibration of photodiode sensitivity for atomic force microscopy
YKI – Ytkemiska institutet.
2006 (English)In: Review of Scientific Instruments, ISSN 0034-6748, E-ISSN 1089-7623, Vol. 77, Art No 1161107/1-116110/4Article in journal (Refereed)
Abstract [en]

The photodiode sensitivity in the atomic force microscope is calibrated by relating the voltage noise to the thermal fluctuations of the cantilever angle. The method accounts for the ratio of the thermal fluctuations measured in the fundamental vibration mode to the total, and also for the tilt and extended tip of the cantilever. The method is noncontact and is suitable for soft or deformable surfaces where the constant compliance method cannot be used. For hard surfaces, the method can also be used to calibrate the cantilever spring constant.

Place, publisher, year, edition, pages
2006. Vol. 77, Art No 1161107/1-116110/4
Keyword [en]
In-situ calibration, spring constant, cantilevers, friction
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-27457OAI: oai:DiVA.org:ri-27457DiVA: diva2:1054462
Note
A1859Available from: 2016-12-08 Created: 2016-12-08Bibliographically approved

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