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Direct measurement of repulsive and attractive van der Waals forces between inorganic materials
YKI – Ytkemiska institutet.
1997 (English)In: Langmuir, ISSN 0743-7463, E-ISSN 1520-5827, Vol. 13, 3896-3899 p.Article in journal (Refereed)
Abstract [en]

The repulsive and attractive interactions between silicon nitride and silica across diiodomethane and 1-bromonaphtalene were measured using an atomic force microscope (AFM). By combining measuremnets of asymmetric (silicon nitride versus silica) and symmetric (silicon nitride versus silicon nitride) material combinations in these solvents, a thorough analysis of the nature of the observed force curves was enabled. The sign, magnitude and separation distance scaling of the interactions could be well described with a van der Waals interaction between a flat surface and a sphere using calculated Hamaker constants from Lifshitz theory.

Place, publisher, year, edition, pages
1997. Vol. 13, 3896-3899 p.
Keyword [en]
van der Waals interaction, Hamaker constant, atomic force microscope
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-27260OAI: oai:DiVA.org:ri-27260DiVA: diva2:1054264
Note
A1096Available from: 2016-12-08 Created: 2016-12-08Bibliographically approved

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