The repulsive and attractive interactions between silicon nitride and silica across diiodomethane and 1-bromonaphtalene were measured using an atomic force microscope (AFM). By combining measuremnets of asymmetric (silicon nitride versus silica) and symmetric (silicon nitride versus silicon nitride) material combinations in these solvents, a thorough analysis of the nature of the observed force curves was enabled. The sign, magnitude and separation distance scaling of the interactions could be well described with a van der Waals interaction between a flat surface and a sphere using calculated Hamaker constants from Lifshitz theory.