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Ellipsometry studies of interfacial film formation in emulsion systems
YKI – Ytkemiska institutet.
1995 (English)In: Journal of Colloid and Interface Science, ISSN 0021-9797, E-ISSN 1095-7103, Vol. 173, 297-303 p.Article in journal (Refereed)
Abstract [en]

The possibility of using in situ ellipsometry for studies of the formation of interfacial films in emulsion systems was investigated. It was found that ellipsometry studies on dilute emulsion can provide information on both the adsorption kinetics, the adsorbed layer structure and the mechanisms for the adsorbed layer formation. At high electrolyte concentrations, the adsorption from a model o/w emulsion stabilized by egg lecithin was found to be more pronounced at hydrophilic and negatively charged silica than at hydrophobic methylated silica. Furthermore, the adsorbed layer thickness at both surfaces is smaller than the average droplet size, corresponding to either small or ”flattened” droplets or liposomes. The adsorbed layer thickness is smaller at methylated silica than at silica, presumably due to a larger degree of emulsion droplet or liposome spreading at this surface. In both cases, the adsorbed layer thickness is independent of the adsorbed amount, i. e. the adsorbed layer formation proceeds by attachment of droplets, which pack more densly with an increasing adsorbed amount.

Place, publisher, year, edition, pages
1995. Vol. 173, 297-303 p.
Keyword [en]
Adsorption, ellipsometry, emulsion, film_x0010_
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-26759OAI: oai:DiVA.org:ri-26759DiVA: diva2:1053762
Note
A941Available from: 2016-12-08 Created: 2016-12-08Bibliographically approved

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