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Application of charge regulation model for evaluation of surface ionization parameters from atomic force microscopy (AFM) data
YKI – Ytkemiska institutet.
YKI – Ytkemiska institutet.
YKI – Ytkemiska institutet.
2000 (English)In: Colloids and Surfaces A: Physicochemical and Engineering Aspects, ISSN 0927-7757, E-ISSN 1873-4359, Vol. 164, 3-7 p.Article in journal (Refereed)
Abstract [en]

The present state of affairs with calculation of electrostatic interaction between two charge regulated surfaces is briefly reviewed, placing a special emphasis on assumptions and limitations of underlying physical models. An application of the charge regulation model for evaluation of surface ionization parameters from the interaction force profile measured with an atomic force microscope in a symmetric silica¯silica system is demonstrated. The site density and the dissociation equilibrium constant of surface silanols are determined. As can be judged from the results obtained, surface silanols are considerably more acidic than it was considered before.

Place, publisher, year, edition, pages
2000. Vol. 164, 3-7 p.
Keyword [en]
Charge regulation model, surface ionization parameters, atomic force microscopy
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-26443OAI: oai:DiVA.org:ri-26443DiVA: diva2:1053445
Note
A1276Available from: 2016-12-08 Created: 2016-12-08Bibliographically approved

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