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Optimal test planning for High Cycle Fatigue limit testing
RISE, Swedish ICT, SICS. IAM.
Number of Authors: 1
2011 (English)In: Annals of Operations Research, 1-10 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
Springer Netherlands , 2011, 7. 1-10 p.
National Category
Computer and Information Science
Identifiers
URN: urn:nbn:se:ri:diva-23990DOI: 10.1007/s10479-010-0810-2OAI: oai:DiVA.org:ri-23990DiVA: diva2:1043069
Note
10.1007/s10479-010-0810-2Available from: 2016-10-31 Created: 2016-10-31Bibliographically approved

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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
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