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The EMRP project GraphOhm- Towards quantum resistance metrology based on graphene
PTB Physikalisch-Technische Bundesanstalt, Germany.
Cesky Metrologicky Institut, Czech Republic.
Laboratoire National de Métrologie et d'Essais, France.
Cesky Metrologicky Institut, Czech Republic.
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2014 (English)In: CPEM 2014, 2014, , p. 548 - 549p. 548-549, article id 6898502Conference paper, Published paper (Refereed)
Abstract [en]

A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures (above 4.2 K, and up to 8 K) and together with lower magnetic fields (below 5 T, and potentially down to 2 T) will lead to a significantly improved and cost-saving dissemination of intrinsically referenced resistance standards to all end-users relying on electrical measurements.

Place, publisher, year, edition, pages
2014. , p. 548 - 549p. 548-549, article id 6898502
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-12481DOI: 10.1109/CPEM.2014.6898502Scopus ID: 2-s2.0-84907899372Local ID: 23798OAI: oai:DiVA.org:ri-12481DiVA, id: diva2:970305
Conference
CPEM Digest (Conference on Precision Electromagnetic Measurements)(CPEM 2014) Rio de Janeiro 24-29 Aug. 2014 (ISSN: 0589-1485)
Available from: 2016-09-13 Created: 2016-09-13 Last updated: 2023-06-08Bibliographically approved

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Bergsten, Tobias

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