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Analysis of corrugated soft edges to reduce scattering from gaps between reflecting panels
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Elektronik, EMC.
2005 (English)Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2005.
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:ri:diva-11563Local ID: 6230OAI: oai:DiVA.org:ri-11563DiVA, id: diva2:969385
Conference
IEEE AP-S International Symposium and URSI Science Meeting, Ann arbor, Michigan, USA, June 28 – July 2, 1993.
Available from: 2016-09-13 Created: 2016-09-13 Last updated: 2020-12-01Bibliographically approved

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Total: 87 hits
CiteExportLink to record
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