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A Broadband Conversion Loss Measurement Technique for Terahertz Harmonic Mixers
RISE Research Institutes of Sweden, Safety and Transport, Measurement Technology. Chalmers University of Technology, Sweden.ORCID iD: 0000-0002-5726-327x
Virginia Diodes Inc, USA.
Virginia Diodes Inc, USA.
Chalmers University of Technology, Sweden.
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2024 (English)In: IEEE Transactions on Terahertz Science and Technology, ISSN 2156-342X, E-ISSN 2156-3446, Vol. 14, no 3, p. 424-427Article in journal (Refereed) Published
Abstract [en]

This letter presents an experimental characterization technique for assessing the performance of terahertz harmonic mixers across a wide frequency range. The total signal transfer loss of three mixers was measured in both up- and down-conversion configurations, and the conversion loss was determined through the solution of a linear system of equations. The proposed method uses LO signals with a frequency offset to ensure single sideband measurements, thereby eliminating the need for image-reject filters. The three-mixer method was verified by measurements of millimeter-wave mixers, which matched the traditional characterization method using a calibrated source and power meter. Given this successful millimeter-wave demonstration, we characterized three WM-86 Schottky diode × 4-harmonic mixers from 2.2 to 3 THz. This technique presents a notable advantage for conducting broadband mixer characterizations, particularly in the terahertz frequency regime, which lacks tunable, wideband sources.

Place, publisher, year, edition, pages
IEEE Microwave Theory and Techniques Society , 2024. Vol. 14, no 3, p. 424-427
Keywords [en]
Amplitude modulation; Bandpass filters; Frequency modulation; Heterodyning; Linear systems; Matched filters; Millimeter waves; Mixers (machinery); Notch filters; Schottky barrier diodes; Terahertz waves; Frequency measurements; Harmonic mixers; Heterodyne receivers; Loss measurement; Millimeter-wave mixer; Power harmonic filters; Radiofrequencies; Sub-millimeter wave mixer; Sub-millimeter waves; Terahertz metrology; Harmonic analysis
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:ri:diva-73853DOI: 10.1109/TTHZ.2024.3368660Scopus ID: 2-s2.0-85186108633OAI: oai:DiVA.org:ri-73853DiVA, id: diva2:1879545
Available from: 2024-06-28 Created: 2024-06-28 Last updated: 2024-06-28Bibliographically approved

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Jayasankar, Divya

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