Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Time-of-flight secondary ion mass spectrometry imaging of dopant diffusion in optical fiber
RISE, Swedish ICT, Acreo.
Show others and affiliations
2003 (English)In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 203-204, p. 3458-61Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2003. Vol. 203-204, p. 3458-61
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:ri:diva-32240OAI: oai:DiVA.org:ri-32240DiVA, id: diva2:1152099
Available from: 2017-10-24 Created: 2017-10-24 Last updated: 2019-06-27Bibliographically approved

Open Access in DiVA

No full text in DiVA

Authority records BETA

Hellsing, Maja

Search in DiVA

By author/editor
Hellsing, Maja
By organisation
Acreo
In the same journal
Applied Surface Science
Computer and Information Sciences

Search outside of DiVA

GoogleGoogle Scholar

urn-nbn

Altmetric score

urn-nbn
Total: 5 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
v. 2.35.7