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Influence of waveguide width errors on TRL and LRL calibrations
RISE., SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik. Chalmers University of Technology, Sweden.
RISE., SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation. Chalmers University of Technology, Sweden.
RISE., SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik. Chalmers University of Technology, Sweden.
Chalmers University of Technology, Sweden.
Vise andre og tillknytning
2012 (engelsk)Inngår i: 79th ARFTG Microwave Measurement Conference: Non-Linear Measurement Systems, 2012, , s. 6291182artikkel-id 6291182Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

This paper investigates the impact of the waveguide width tolerance in TE 10 mode waveguide TRL/LRL calibration kits. This is important for vector network analyzer measurements in the THZ range where waveguide tolerances become large compared the wavelength and to cross sectional dimensions. Besides causing reflections in the waveguide interface, the waveguide width tolerance also causes a change in the propagation constant that can shift the reference planes and cause problems in estimating the propagation constant of the Line standard. We conclude that the tolerances may cause a significant uncertainty contribution and may limit the useful band of the calibration kit.

sted, utgiver, år, opplag, sider
2012. , s. 6291182artikkel-id 6291182
Emneord [en]
LRL, Propagation constant, Reference plane, TRL, uncertainty, Vector network analyzers, VNA, Waveguide interfaces
HSV kategori
Identifikatorer
URN: urn:nbn:se:ri:diva-12516DOI: 10.1109/ARFTG79.2012.6291182Scopus ID: 2-s2.0-84867805916Lokal ID: 23928OAI: oai:DiVA.org:ri-12516DiVA, id: diva2:970340
Konferanse
79th ARFTG Microwave Measurement Conference: Non-Linear Measurement Systems, ARFTG 2012; Montreal, QC; Canada; 22 June, 2012
Tilgjengelig fra: 2016-09-13 Laget: 2016-09-13 Sist oppdatert: 2020-12-21bibliografisk kontrollert

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