Endre søk
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
A Comparison of Inject-on-Read and Inject-on-Write in ISA-Level Fault Injection
Chalmers University of Technology, Sweden.ORCID-id: 0000-0001-9536-4269
2016 (engelsk)Inngår i: Proceedings - 2015 11th European Dependable Computing Conference, EDCC 2015, Institute of Electrical and Electronics Engineers Inc. , 2016, s. 178-189Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

ISA-level fault injection, i.e. the injection of bit-flip faults in Instruction Set Architecture (ISA) registers and main memory words, is widely used for studying the impact of transient and intermittent hardware faults in computer systems. This paper compares two techniques for ISA-level fault injection: inject-on-read, and inject-on-write. The first technique injects bit-flips in a data-item (the content of a register or memory word) just before the data-item is read by a machine instruction, while the second one injects bit-flips in a data-item just after it has been updated by a machine instruction. In addition, the paper compares two variants of inject-on-read, one where all faults are given the same weight and one where weight factors are used to reflect the time a data-item spends in a register or memory word. The weighted injected-on-read aims to accurately model soft errors that occur when an ionizing particle perturbs a data-item while it resides in an ISA register or a memory word. This is in contrast to inject-on-write, which emulates errors that propagate into an ISA register or a memory word. Our experiments show significant differences in the results obtained with the three techniques.

sted, utgiver, år, opplag, sider
Institute of Electrical and Electronics Engineers Inc. , 2016. s. 178-189
Emneord [en]
brake-by-wire system, inject-on-read, inject-on-write, ISA-level fault injection, single bit-flips, Computer hardware, Radiation hardening, Software testing, Brake-by-wire systems, Fault injection, Single bit flips, Computer architecture
HSV kategori
Identifikatorer
URN: urn:nbn:se:ri:diva-56957DOI: 10.1109/EDCC.2015.24Scopus ID: 2-s2.0-84966373440ISBN: 9781467392891 (tryckt)OAI: oai:DiVA.org:ri-56957DiVA, id: diva2:1612785
Konferanse
11th European Dependable Computing Conference, EDCC 2015, 7 September 2015 through 11 September 2015
Tilgjengelig fra: 2021-11-19 Laget: 2021-11-19 Sist oppdatert: 2023-04-28bibliografisk kontrollert

Open Access i DiVA

Fulltekst mangler i DiVA

Andre lenker

Forlagets fulltekstScopus

Person

Sangchoolie, Behrooz

Søk i DiVA

Av forfatter/redaktør
Sangchoolie, Behrooz

Søk utenfor DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric

doi
isbn
urn-nbn
Totalt: 3 treff
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
v. 2.45.0