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Characterization of surface topography of a newly developed metrological gloss scale
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Massa, kraft, längd och tryck. Halmstad University, Sweden.ORCID iD: 0000-0001-7501-8318
RISE, SP – Sveriges Tekniska Forskningsinstitut, SP Mätteknik, Kommunikation.
LNE Laboratoire national de métrologie et d'essais, France.
LNE Laboratoire national de métrologie et d'essais, France.
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2015 (English)In: Surface Topography: Metrology and Properties, ISSN 2051-672X, Vol. 3, no 4, article id 045001Article in journal (Refereed) Published
Abstract [en]

In the European Joint Research Project “Multidimensional reflectometry for industry”, a new gloss scale has been developed with the aim to represent different levels of gloss, hue, roughness and refractive indices. In this paper, the surfaces of six selected samples have been thoroughly investigated using various measuring techniques in order to verify the outcome of the novel manufacturing processes in terms of distinct levels as well as types of surface roughness. The aim of the evaluation was to capture surface structures in different wavelength intervals utilizing a confocal microscope, a coherence scanning interferometer and an atomic force microscope. Also, PSD functions calculated from the measurements have been used to determine suitability of techniques for different roughness scales. Measurements show the expected surface characteristics as well as different rms roughness values intimately connected to the perceived glossiness.

Place, publisher, year, edition, pages
2015. Vol. 3, no 4, article id 045001
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Natural Sciences
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URN: urn:nbn:se:ri:diva-6916DOI: 10.1088/2051-672X/3/4/045001Scopus ID: 2-s2.0-84979198389Local ID: 30814OAI: oai:DiVA.org:ri-6916DiVA, id: diva2:964758
Available from: 2016-09-08 Created: 2016-09-08 Last updated: 2021-05-04Bibliographically approved

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Flys, Olena

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