New reference measurement system for calibration of VLF high voltage 2010 (English)In: CPEM Digest (Conference on Precision Electromagnetic Measurements), 2010, p. 682-683Conference paper, Published paper (Refereed)

Abstract [en]

A reference measuring system for 200 kV at very low frequency (0.1 Hz, VLF) has been developed and verified. The reference system will make it possible to perform traceable calibration of VLF test systems used for after-laying-tests of extruded power cables. © 2010 IEEE.

Place, publisher, year, edition, pages

2010. p. 682-683

Keywords [en]

High voltage, Measuring systems, Power cables, Reference measurement system, Reference systems, Test systems, Traceable calibration, Very low frequency, Calibration, Electromagnetism, Measurements

National Category

Electrical Engineering, Electronic Engineering, Information Engineering

Identifiers

URN: urn:nbn:se:ri:diva-32475DOI: 10.1109/CPEM.2010.5543426Scopus ID: 2-s2.0-77956620857ISBN: 9781424467952 (print)OAI: oai:DiVA.org:ri-32475DiVA, id: diva2:1154728

Conference

2010 Conference on Precision Electromagnetic Measurements, CPEM 2010, 13 June 2010 through 18 June 2010, Daejeon

Available from: 2017-11-03 Created: 2017-11-03 Last updated: 2020-12-01Bibliographically approved

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Authority records

Bergman, Anders

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SP – Sveriges Tekniska Forskningsinstitut

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